Please use this identifier to cite or link to this item:
https://observatorio.fm.usp.br/handle/OPI/17021
Title: | Interval Simulated Annealing applied to Electrical Impedance Tomography image reconstruction with fast objective function evaluation |
Authors: | MARTINS, Thiago de Castro; TSUZUKI, Marcos de Sales Guerra; CAMARGO, Erick Dario Leon Bueno de; LIMA, Raul Gonzalez; MOURA, Fernando Silva de; AMATO, Marcelo Brito Passos |
Citation: | COMPUTERS & MATHEMATICS WITH APPLICATIONS, v.72, n.5, p.1230-1243, 2016 |
Abstract: | The Electrical Impedance Tomography (EIT) reconstruction problem can be solved as an optimization problem in which the discrepancy between a simulated impedance domain and the observed one is minimized. This optimization problem can be solved by a combination of Simulated Annealing (SA) for optimization and the Finite Element Method (FEM) for simulating the impedance domain. A new objective function based on the total least squares error minimization is proposed. This objective function is ill-conditioned with dense meshes. Two possibilities to overcome ill-conditioning are considered: combination with another objective function (Euclidean distance) and inclusion of a regularization term. To speed up the algorithm, results from previous iterations are used to improve the present iteration convergence, and a preconditioner is proposed. This new reconstruction approach is evaluated with experimental data and compared with previous approaches. |
Appears in Collections: | Artigos e Materiais de Revistas Científicas - FM/MCP Artigos e Materiais de Revistas Científicas - HC/InCor Artigos e Materiais de Revistas Científicas - LIM/09 |
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art_MARTINS_Interval_Simulated_Annealing_applied_to_Electrical_Impedance_Tomography_2016.PDF Restricted Access | publishedVersion (English) | 2.27 MB | Adobe PDF | View/Open Request a copy |
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